\begin{figure}[tp]
\begin{center}
\includegraphics[width=0.7\textwidth]{00-1_0-10_vasp_s.ps}
-%\includegraphics[width=13cm]{vasp_mig/00-1_0-10_nosym_sp_fullct.ps}\\[1.6cm]
-%\begin{picture}(0,0)(140,0)
-%\includegraphics[width=2.5cm]{vasp_mig/00-1_a.eps}
-%\end{picture}
-%\begin{picture}(0,0)(20,0)
-%\includegraphics[width=2.5cm]{vasp_mig/00-1_0-10_sp.eps}
-%\end{picture}
-%\begin{picture}(0,0)(-120,0)
-%\includegraphics[width=2.5cm]{vasp_mig/0-10.eps}
-%\end{picture}
-%\begin{picture}(0,0)(25,20)
-%\includegraphics[width=2.5cm]{100_arrow.eps}
-%\end{picture}
-%\begin{picture}(0,0)(200,0)
-%\includegraphics[height=2.2cm]{001_arrow.eps}
-%\end{picture}
\end{center}
\caption[Migration barrier and structures of the \hkl<0 0 -1> DB (left) to the \hkl<0 -1 0> DB (right) transition.]{Migration barrier and structures of the \hkl[0 0 -1] DB (left) to the \hkl[0 -1 0] DB (right) transition. Bonds of the C atom are illustrated by blue lines. {\color{red} Prototype design, adjust related figures!}}
% todo read above caption! enable [] hkls in short caption
\begin{center}
\includegraphics[width=0.7\textwidth]{00-1_110_0-10_mig_albe.ps}
\end{center}
-\caption[Migration barrier and structures of the \ci{} \hkl<0 0 -1> (left) to the \hkl<0 -1 0> DB (right) transition involving the \hkl<1 1 0> DB (center) configuration.]{Migration barrier and structures of the \ci{} \hkl[0 0 -1] (left) to the \hkl[0 -1 0] DB (right) transition involving the \hkl[1 1 0] DB (center) configuration. Migration simulations were performed utilizing time constants of \unit[1]{fs} (solid line) and \unit[100]{fs} (dashed line) for the Berendsen thermostat.}
+\caption[Migration barrier and structures of the \ci{} \hkl<0 0 -1> (left) to the \hkl<0 -1 0> DB (right) transition involving the \hkl<1 1 0> DB (center) configuration.]{Migration barrier and structures of the \ci{} \hkl[0 0 -1] (left) to the \hkl[0 -1 0] DB (right) transition involving the \hkl[1 1 0] DB (center) configuration. Migration simulations are performed utilizing time constants of \unit[1]{fs} (solid line) and \unit[100]{fs} (dashed line) for the Berendsen thermostat.}
\label{fig:defects:involve110}
\end{figure}
Approximately \unit[2.2]{eV} are needed to turn the \ci{} \hkl[0 0 -1] into the \hkl[1 1 0] DB located at the neighbored lattice site in \hkl[1 1 -1] direction.
The study proceeds with a structural and energetic investigation of pairs of the ground-state and, thus, most probable defect configurations that are believed to be fundamental in the Si to SiC conversion.
Investigations are restricted to quantum-mechanical calculations.
\begin{figure}[tp]
+% ./visualize_contcar -w 640 -h 480 -d results/.../CONTCAR -nll -0.20 -0.20 -0.6 -fur 1.2 1.2 0.6 -c 0.5 -1.5 0.3 -L 0.5 0 0 -r 0.6 -m 3.0 0.0 0.0 0.0 3.0 0.0 0.0 0.0 3.0 -A -1 2.465
\begin{center}
-\subfigure[]{\label{fig:defects:combos_ci}\includegraphics[width=0.3\textwidth]{combos_ci.eps}}
+\subfigure[]{\label{fig:defects:combos_ci}\includegraphics[width=0.3\textwidth]{combos_ci_col.eps}}
\hspace{0.5cm}
\subfigure[]{\label{fig:defects:combos_si}\includegraphics[width=0.3\textwidth]{combos.eps}}
\end{center}
-\caption{Position of the initial \ci{} \hkl[0 0 -1] DB (I) (a) and of the lattice site chosen for the initial \si{} \hkl<1 1 0> DB (\si) (b). Lattice sites for the second defect used for investigating defect pairs are numbered from 1 to 5.}
+\caption{Position of the initial \ci{} \hkl[0 0 -1] DB (I) (a) and of the lattice site chosen for the initial \si{} \hkl<1 1 0> DB (\si) (b). Lattice sites for the second defect used for investigating defect pairs are numbered from 1 to 5. For black/red/blue numbers, one/two/four possible atom(s) exist for the second defect to create equivalent defect combinations.}
\label{fig:defects:combos}
\end{figure}
Fig.~\ref{fig:defects:combos} schematically displays the initial \ci{} \hkl[0 0 -1] DB structure (Fig.~\ref{fig:defects:combos_ci}) as well as the lattice site chosen for the initial \si{} \hkl<1 1 0> DB (Fig.~\ref{fig:defects:combos_si}) and various positions for the second defect (1-5) that are used for investigating defect pairs.
+The color of the number denotes the amount of possible atoms for the second defect resulting in equivalent configurations.
Binding energies of the defect pair are determined by equation \ref{eq:basics:e_bind}.
-Next to formation and binding energies, migration barriers are investigated, which allow to draw conclusions on the probability of the formation of such defect complexes by thermally activated diffusion processes.
+Next to formation and binding energies, migration barriers are investigated, which allow to draw conclusions on the probability of the formation of such defect complexes by thermally activated diffusion processes.
\subsection[Pairs of \ci{} \hkl<1 0 0>-type interstitials]{\boldmath Pairs of \ci{} \hkl<1 0 0>-type interstitials}
\label{subsection:defects:c-si_comb}
Based on the lowest energy migration path of a single \ci{} \hkl<1 0 0> DB, the configuration, in which the second \ci{} DB is oriented along \hkl[0 1 0] at position 2 is assumed to constitute an ideal starting point for a transition into the ground state.
In addition, the starting configuration exhibits a low binding energy (\unit[-1.90]{eV}) and is, thus, very likely to occur.
-However, a barrier height of more than \unit[4]{eV} is detected resulting in a low probability for the transition.
+However, a smooth transition path is not found.
+Intermediate configurations within the investigated turbulent pathway identify barrier heights of more than \unit[4]{eV} resulting in a low probability for the transition.
The high activation energy is attributed to the stability of such a low energy configuration, in which the C atom of the second DB is located close to the initial DB.
+Due to an effective stress compensation realized in the respective low energy configuration, which will necessarily be lost during migration, a high energy configuration needs to get passed, which is responsible for the high barrier.
Low barriers are only identified for transitions starting from energetically less favorable configurations, e.g. the configuration of a \hkl[-1 0 0] DB located at position 2 (\unit[-0.36]{eV}).
Starting from this configuration, an activation energy of only \unit[1.2]{eV} is necessary for the transition into the ground state configuration.
The corresponding migration energies and atomic configurations are displayed in Fig.~\ref{fig:036-239}.
\label{fig_defects:245csub}
\end{figure}
Fig.~\ref{fig_defects:245csub} lists the remaining configurations and binding energies of the relaxed structures obtained by creating a \cs{} at positions 2, 4 and 5 in the \ci{} \hkl[0 0 -1] DB configuration.
+% todo explain some configurations, source: old text some lines below
% c agglomeration vs c clustering ... migs to b conf
% 2 more migs: 051 -> 128 and 026! forgot why ... probably it's about probability of C clustering
-Obviously agglomeration of C$_{\text{i}}$ and C$_{\text{s}}$ is energetically favorable except for separations along one of the \hkl<1 1 0> directions.
+Obviously, agglomeration of C$_{\text{i}}$ and C$_{\text{s}}$ is energetically favorable except for separations along one of the \hkl<1 1 0> directions.
The energetically most favorable configuration (configuration b) forms a strong but compressively strained C-C bond with a separation distance of \unit[0.142]{nm} sharing a Si lattice site.
-Again, conclusions concerning the probability of formation are drawn by investigating migration paths.
+Again, conclusions concerning the probability of formation are drawn by investigating respective migration paths.
Since C$_{\text{s}}$ is unlikely to exhibit a low activation energy for migration the focus is on C$_{\text{i}}$.
-Pathways starting from the two next most favored configurations were investigated, which show activation energies above \unit[2.2]{eV} and \unit[3.5]{eV} respectively.
+Pathways starting from the next most favored configuration, i.e. \cs{} located at position 2, into configuration a and b are investigated, which show activation energies above \unit[2.2]{eV} and \unit[2.5]{eV}.
+The respective barriers and structures are shown in Fig.~\ref{fig:051-xxx}.
+\begin{figure}[tp]
+\begin{center}
+\includegraphics[width=0.7\textwidth]{comb_mig_051-xxx_conf.ps}
+\end{center}
+\caption{Migration barrier and structures of the transition of a configuration equivalent to the one of the initial \hkl<1 0 0> \ci{} DB with \cs{} located at position 2 into the a and b configurations.}
+\label{fig:051-xxx}
+\end{figure}
Although lower than the barriers for obtaining the ground state of two C$_{\text{i}}$ defects, the activation energies are yet considered too high.
For the same reasons as in the last subsection, structures other than the ground-state configuration are, thus, assumed to arise more likely due to much lower activation energies necessary for their formation and still comparatively low binding energies.
Si atoms 1 and 2, which form the initial DB, occupy Si lattice sites in the final configuration while Si atom 3 is transferred from a regular lattice site into the interstitial lattice.
These results support the above assumptions of an increased entropic contribution to structural formation involving C$_{\text{s}}$ to a greater extent.
-
% link to migration of \si{}!
The possibility for separated configurations of \cs{} and \si{} becomes even more likely if one of the constituents exhibits a low barrier of migration.
In this case, the \si{} is assumed to constitute the mobile defect compared to the stable \cs{} atom.
-Acoording to Fig.~\ref{fig:defects:si_mig1}, an activation energy of \unit[0.67]{eV} is necessary for the transition of the \si{} \hkl[0 1 -1] to \hkl[1 1 0] DB located at the neighbored Si lattice site in \hkl[1 1 -1] direction.
-Indeed, the transition ... equal to as if cs is near ..
-Further ...
-
+Acoording to Fig.~\ref{fig:defects:si_mig1}, an activation energy of \unit[0.67]{eV} is necessary for the transition of the \si{} \hkl[0 -1 1] to \hkl[1 1 0] DB located at the neighbored Si lattice site in \hkl[1 1 -1] direction.
+\begin{figure}[tp]
+\begin{center}
+\includegraphics[width=0.7\textwidth]{si_110_110_mig_02_conf.ps}
+\end{center}
+\caption[Migration barrier and structures of the \si{} \hkl<1 1 0> DB.]{Migration barrier and structures of the \si{} \hkl[0 -1 1] DB (left) to the \hkl[1 1 0] DB (right) transition. Bonds are illustrated by blue lines.}
+% todo read above caption! enable [] hkls in short caption
+\label{fig:defects:si_mig1}
+\end{figure}
+The barrier, which is even lower than the one for \ci{}, indeed indicates highly mobile \si.
+In fact, a similar transition is expected if the \si{} atom, which does not change the lattice site during transition, is located next to a \cs{} atom.
+Further investigations revealed transition barriers of \unit[0.94]{eV} for the Si$_{\text{i}}$ \hkl[1 1 0] DB to the hexagonal Si$_{\text{i}}$, \unit[0.53]{eV} for the Si$_{\text{i}}$ \hkl[1 1 0] DB to the tetrahedral Si$_{\text{i}}$ and \unit[0.35]{eV} for the hexagonal Si$_{\text{i}}$ to the tetrahedral Si$_{\text{i}}$ configuration.
+The respective configurational energies are shown in Fig.~\ref{fig:defects:si_mig2}.
+\begin{figure}[tp]
+\begin{center}
+\includegraphics[width=0.7\textwidth]{si_mig_rest.ps}
+\end{center}
+\caption{Migration barrier of the \si{} \hkl[1 1 0] DB into the hexagonal (H) and tetrahedral (T) configuration as well as the hexagonal \si{} to tetrahedral \si{} transition.}
+% todo read above caption! enable [] hkls in short caption
+\label{fig:defects:si_mig2}
+\end{figure}
+The obtained activation energies are of the same order of magnitude than values derived from other ab initio studies \cite{bloechl93,sahli05}.
+The low barriers indeed enable configurations of separated \cs{} and \si{}.
% kept for nostalgical reason!
Comparatively high energies necessary for the reverse process reveal this configuration to be extremely stable.
Thus, C interstitials and vacancies located close together are assumed to end up in such a configuration, in which the C atom is tetrahedrally coordinated and bound to four Si atoms as expected in SiC.
-Investigating configurations of C$_{\text{s}}$ and Si$_{\text{i}}$, formation energies higher than that of the C$_{\text{i}}$ \hkl<1 0 0> DB were obtained keeping up previously derived assumptions concerning the ground state of C$_{\text{i}}$ in otherwise perfect Si.
+Investigating configurations of C$_{\text{s}}$ and Si$_{\text{i}}$, formation energies higher than that of the C$_{\text{i}}$ \hkl<1 0 0> DB are obtained keeping up previously derived assumptions concerning the ground state of C$_{\text{i}}$ in otherwise perfect Si.
However, a small capture radius is identified for the respective interaction that might prevent the recombination of defects exceeding a separation of \unit[0.6]{nm} into the ground state configuration.
In addition, a rather small activation energy of \unit[0.77]{eV} allows for the formation of a C$_{\text{s}}$-Si$_{\text{i}}$ pair originating from the C$_{\text{i}}$ \hkl<1 0 0> DB structure by thermally activated processes.
Thus, elevated temperatures might lead to thermodynamically unstable configurations of C$_{\text{s}}$ and a remaining Si atom in the near interstitial lattice, which is supported by the result of an {\em ab initio} molecular dynamics run.
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