-\caption{Relaxed structures of defect complexes obtained by creating vacancies at positions 2 (a)), 3 (b)), 4 (c)) and 5 (d)).}
-\label{fig:defects:comb_db_06}
-\end{figure}
-Figure \ref{fig:defects:comb_db_06} displays relaxed structures of vacancies in combination with the \hkl<0 0 -1> dumbbell interstital.
-The creation of a vacancy at position 1 results in a configuration of substitutional carbon on a silicon lattice site and no other remaining defects.
-The carbon dumbbell atom moves to position 1 where the vacancy is created and the silicon dumbbell atom recaptures the dumbbell lattice site.
-With a binding energy of -5.39 eV, this is the energetically most favorable configuration observed.
-A great amount of strain energy is reduced by removing the silicon atom at position 3, which is illustrated in figure \ref{fig:defects:comb_db_06} b).
-The dumbbell structure shifts towards the position of the vacancy which replaces the silicon atom usually bond to and at the same time strained by the silicon dumbbell atom.
-Due to the displacement into the \hkl<1 -1 0> direction the bond of the dumbbell silicon atom to the silicon atom on the top left breaks and instead forms a bond to the silicon atom located in \hkl<1 -1 1> direction which is not shown in the figure.
-A binding energy of -3.14 eV is obtained for this structure composing another energetically favorable configuration.
-
-Vacancies created at positions 2 and 4 have similar
-
-Vac at position 2 and 4 have similar results.
-Less strain is reduced, since the displacement of the bottom silicon atom, whcih would be directly bond to the silicon atom replaced by the vacancy, is less.
-In the second case, there is even less strain reduction since the second next neighbour is replaced by the vacancy.
-A symmetric configuration is expected, but it is not!
-jahn-Teller distortion ... check this!
-In both cases the db is tilted in such a way, that the carbon atom moves towards the vacancy.
-At position 5 the silicon dumbbell atom moves in \hkl<1 1 0> direction, the same direction where the vacancy is located.
-Strain reducde by this is partialy absorbed by strain originating from the fact that si atom bound to and pulled by the carbon atom is also pulled by the vacancy.
-
-CHECK C-C DIST AND SI-C DIST !!! of all!!!
-
-{\color{red}Todo: Jahn-Teller distortion (vacancy) $\rightarrow$ actually three possibilities? Due to the initial defect symmetries are broken. It should have relaxed into the minumum energy configuration!?}
-Once a vacancy exists the minimal e conf is the c sub conf and ofcourse necessary for formation of SiC.
-The question is whether the migration into this conf is possible.
-Due to low e of conf at pos 3, this might constitute a trap.
-Thats why we havt to look at migration barriers into the configurations beneficial for SiC prec.
-Fig shows the migration of the 2 and 3 conf into the c sub conf.
-Low migration barriers, which means that SiC will modt probably form ... and so on ...
-
-{\color{red}Todo: Si int and C sub ...}
-The existance of a vacancy is most often accompanied by an interstitial.
-The silicon interstitital might diffuse to the surface or recombine with other vacancy defects and tus is out of the interested simulation region.
-However, investigation of near by vacancy, Si and C interstititla is necessary, too.
-As for the ground state of the single Si self-int a 110 this is also assumed as the lowest possibility in combination with other defects, which is a cruel assumption!!!
-
-{\color{red}Todo: Model of kick-out and kick-in mechnism?}
-
-
-\section{Conclusions for SiC preciptation}
+\caption{Formation energies of defect configurations of a single C impurity in otherwise perfect c-Si determined by classical potential and {\em ab initio} methods. The formation energies are given in eV. T denotes the tetrahedral and the subscripts i and s indicate the interstitial and substitutional configuration. Superscripts a, b and c denote configurations of C$_{\text{s}}$ located at the first, second and third nearest neighbored lattice site with respect to the Si$_{\text{i}}$ atom.}
+\label{tab:defect_combos}
+\end{table}
+Obviously, the EA potential properly describes the relative energies of formation.
+Combined structures of C$_{\text{s}}$ and Si$_{\text{i}}$ T are energetically less favorable than the ground state C$_{\text{i}}$ \hkl<1 0 0> DB configuration.
+With increasing separation distance, the energies of formation decrease.
+However, even for non-interacting defects, the energy of formation, which is then given by the sum of the formation energies of the separated defects (\unit[4.15]{eV}) is still higher than that of the C$_{\text{i}}$ \hkl<1 0 0> DB.
+Unexpectedly, the structure of a Si$_{\text{i}}$ \hkl<1 1 0> DB and a neighbored C$_{\text{s}}$, which is the most favored configuration of a C$_{\text{s}}$ and Si$_{\text{i}}$ DB according to quantum-mechanical calculations, likewise constitutes an energetically favorable configuration within the EA description, which is even preferred over the two least separated configurations of C$_{\text{s}}$ and Si$_{\text{i}}$ T.
+This is attributed to an effective reduction in strain enabled by the respective combination.
+Quantum-mechanical results reveal a more favorable energy of formation for the C$_{\text{s}}$ and Si$_{\text{i}}$ T (a) configuration.
+However, this configuration is unstable involving a structural transition into the C$_{\text{i}}$ \hkl<1 1 0> DB interstitial, thus, not maintaining the tetrahedral Si nor the \cs{} defect.
+
+Thus, the underestimated energy of formation of C$_{\text{s}}$ within the EA calculation does not pose a serious limitation in the present context.
+Since C is introduced into a perfect Si crystal and the number of particles is conserved in simulation, the creation of C$_{\text{s}}$ is accompanied by the creation of Si$_{\text{i}}$, which is energetically less favorable than the ground state, i.e.\ the C$_{\text{i}}$ \hkl<1 0 0> DB configuration, for both, the EA and {\em ab initio} treatment.
+In either case, no configuration more favorable than the C$_{\text{i}}$ \hkl<1 0 0> DB has been found.
+Thus, a proper description with respect to the relative energies of formation is assumed for the EA potential.
+
+\section{Conclusions concerning the SiC conversion mechanism}
+
+\ifnum1=0
+
+Obtained results for separated point defects in Si are in good agreement to previous theoretical work on this subject, both for intrinsic defects~\cite{leung99,al-mushadani03} as well as for C point defects~\cite{dal_pino93,capaz94}.
+The ground-state configurations of these defects, i.e.\ the Si$_{\text{i}}$ \hkl<1 1 0> and C$_{\text{i}}$ \hkl<1 0 0> DB, are reproduced and compare well to previous findings of theoretical investigations on Si$_{\text{i}}$~\cite{leung99,al-mushadani03} as well as theoretical~\cite{dal_pino93,capaz94,burnard93,leary97,jones04} and experimental~\cite{watkins76,song90} studies on C$_{\text{i}}$.
+A quantitatively improved activation energy of \unit[0.9]{eV} for a qualitatively equal migration path based on studies by Capaz et~al.~\cite{capaz94} to experimental values~\cite{song90,lindner06,tipping87} ranging from \unit[0.70--0.87]{eV} reinforce their derived mechanism of diffusion for C$_{\text{i}}$ in Si
+However, it turns out that the BC configuration is not a saddle point configuration as proposed by Capaz et~al.~\cite{capaz94} but constitutes a real local minimum if the electron spin is properly accounted for.
+A net magnetization of two electrons, which is already clear by simple molecular orbital theory considerations on the bonding of the $sp$ hybridized C atom, is settled.
+By investigating the charge density isosurface it turns out that the two resulting spin up electrons are localized in a torus around the C atom.
+With an activation energy of \unit[0.9]{eV}, the C$_{\text{i}}$ carbon interstitial can be expected to be highly mobile at prevailing temperatures in the process under investigation, i.e.\ IBS.
+Since the \ci{} \hkl<1 0 0> DB is the ground-state configuration and highly mobile, possible migration of these DBs to form defect agglomerates, as demanded by the model introduced in section~\ref{section:assumed_prec}, is considered possible.
+
+Unfortunately, the description of the same processes fails if classical potential methods are used.
+Already the geometry of the most stable DB configuration differs considerably from that obtained by first-principles calculations.
+The classical approach is unable to reproduce the correct character of bonding due to the deficiency of quantum-mechanical effects in the potential.
+Nevertheless, both methods predict the same type of interstitial as the ground-state configuration and also the order in energy of the remaining defects is reproduced fairly well.
+From this, a description of defect structures by classical potentials looks promising.
+%
+However, focusing on the description of diffusion processes the situation changes completely.
+Qualitative and quantitative differences exist.
+First of all, a different pathway is suggested as the lowest energy path, which again might be attributed to the absence of quantum-mechanical effects in the classical interaction model.
+Secondly, the activation energy is overestimated by a factor of 2.4 to 3.5 compared to the more accurate quantum-mechanical methods and experimental findings.
+This is attributed to the sharp cut-off of the short range potential.
+As already pointed out in a previous study~\cite{mattoni2007}, the short cut-off is responsible for overestimated and unphysical high forces of next neighbor atoms.
+The overestimated migration barrier, however, affects the diffusion behavior of the C interstitials.
+By this artifact, the mobility of the C atoms is tremendously decreased resulting in an inaccurate description or even absence of the DB agglomeration as proposed by one of the precipitation models.
+
+Quantum-mechanical investigations of two \ci{} of the \hkl<1 0 0>-type and varying separations and orientations state an attractive interaction between these interstitials.
+Obtained results for the most part compare well with results gained in previous studies~\cite{leary97,capaz98,mattoni2002,liu02} and show an astonishingly good agreement with experiment~\cite{song90}.
+%
+Depending on orientation, energetically favorable configurations are found, in which these two interstitials are located close together instead of the occurrence of largely separated and isolated defects.
+This is due to strain compensation enabled by the combination of such defects in certain orientations.
+For dumbbells oriented along the \hkl<1 1 0> bond chain and the assumption that there is the possibility of free orientation, an interaction energy proportional to the reciprocal cube of the distance in the far field regime is found.
+These findings support the assumption of the \ci{} DB agglomeration.
+%
+The ground state configuration is found to consist of a C-C bond, which is responsible for the vast gain in energy.
+However, based on investigations of possible migration pathways, these structures are less likely to arise than structures, in which both C atoms are interconnected by another Si atom, which is due to high activation energies of the respective pathways or alternative pathways featuring less high activation energies, which, however, involve intermediate unfavorable configurations.
+Thus, agglomeration of C$_{\text{i}}$ is expected while the formation of C-C bonds is assumed to fail to appear by thermally activated diffusion processes.
+
+In contrast, C$_{\text{i}}$ and vacancies are found to efficiently react with each other exhibiting activation energies as low as \unit[0.1]{eV} and \unit[0.6]{eV} resulting in stable C$_{\text{s}}$ configurations.
+In addition, a highly attractive interaction exhibiting a large capture radius, effective independent of the orientation and the direction of separation of the defects, is observed.
+Accordingly, the formation of C$_{\text{s}}$ is very likely to occur.
+Comparatively high energies necessary for the reverse process reveal this configuration to be extremely stable.
+Thus, C interstitials and vacancies located close together are assumed to end up in such a configuration, in which the C atom is tetrahedrally coordinated and bound to four Si atoms as expected in SiC.
+
+Investigating configurations of C$_{\text{s}}$ and Si$_{\text{i}}$, formation energies higher than that of the C$_{\text{i}}$ \hkl<1 0 0> DB are obtained keeping up previously derived assumptions concerning the ground state of C$_{\text{i}}$ in otherwise perfect Si.
+However, a small capture radius is identified for the respective interaction that might prevent the recombination of defects exceeding a separation of \unit[0.6]{nm} into the ground state configuration.
+In addition, a rather small activation energy of \unit[0.77]{eV} allows for the formation of a C$_{\text{s}}$-Si$_{\text{i}}$ pair originating from the C$_{\text{i}}$ \hkl<1 0 0> DB structure by thermally activated processes.
+Thus, elevated temperatures might lead to thermodynamically unstable configurations of C$_{\text{s}}$ and a remaining Si atom in the near interstitial lattice, which is supported by the result of an {\em ab initio} molecular dynamics run.
+%Thus, due to missing attractive interaction forces driving the system to form C-Si \hkl<1 0 0> dumbbell interstitial complexes substitutional C, while thermodynamically not stable, constitutes a most likely configuration occuring in IBS, a process far from equlibrium.
+
+\fi
+
+% todo - sync with conclusion chapter
+
+These findings allow to draw conclusions on the mechanisms involved in the process of SiC conversion in Si.
+% which is elaborated in more detail within the comprehensive description in chapter~\ref{chapter:summary}.
+Agglomeration of C$_{\text{i}}$ is energetically favored and enabled by a low activation energy for migration.
+Although ion implantation is a process far from thermodynamic equilibrium, which might result in phases not described by the Si/C phase diagram, i.e.\ a C phase in Si, high activation energies are believed to be responsible for a low probability of the formation of C-C clusters.
+
+In the context of the initially stated controversy present in the precipitation model, these findings suggest an increased participation of C$_{\text{s}}$ already in the initial stage due to its high probability of incidence.
+In addition, thermally activated, C$_{\text{i}}$ might turn into C$_{\text{s}}$.
+The associated emission of Si$_{\text{i}}$ serves two needs: as a vehicle for other C$_{\text{s}}$ atoms and as a supply of Si atoms needed elsewhere to form the SiC structure.
+As for the vehicle, Si$_{\text{i}}$ is believed to react with C$_{\text{s}}$ turning it into highly mobile C$_{\text{i}}$ again, allowing for the rearrangement of the C atom.
+The rearrangement is crucial to end up in a configuration of C atoms only occupying substitutionally the lattice sites of one of the two fcc lattices that build up the diamond lattice.
+On the other hand, the conversion of some region of Si into SiC by \cs{} is accompanied by a reduction of the volume since SiC exhibits a \unit[20]{\%} smaller lattice constant than Si.
+The reduction in volume is compensated by excess Si$_{\text{i}}$ serving as building blocks for the surrounding Si host or a further formation of SiC.
+
+To conclude, the available results suggest precipitation by successive agglomeration of C$_{\text{s}}$.
+However, the agglomeration and rearrangement of C$_{\text{s}}$ is only possible by mobile C$_{\text{i}}$, which has to be present at the same time.
+Accordingly, the process is governed by both, C$_{\text{s}}$ accompanied by Si$_{\text{i}}$ as well as C$_{\text{i}}$.
+It is worth to mention that there is no contradiction to results of the HREM studies~\cite{werner96,werner97,eichhorn99,lindner99_2,koegler03}.
+Regions showing dark contrasts in an otherwise undisturbed Si lattice are attributed to C atoms in the interstitial lattice.
+However, there is no particular reason for the C species to reside in the interstitial lattice.
+Contrasts are also assumed for Si$_{\text{i}}$.
+Once precipitation occurs, regions of dark contrasts disappear in favor of Moir\'e patterns indicating 3C-SiC in c-Si due to the mismatch in the lattice constant.
+Until then, however, these regions could either be composed of stretched coherent SiC and interstitials or of already contracted incoherent SiC surrounded by Si and interstitials, where the latter is too small to be detected in HREM.
+In both cases, Si$_{\text{i}}$ might be attributed a third role, which is the partial compensation of tensile strain that is present either in the stretched SiC or at the interface of the contracted SiC and the Si host.
+
+Furthermore, the experimentally observed alignment of the \hkl(h k l) planes of the precipitate and the substrate is satisfied by the mechanism of successive positioning of C$_{\text{s}}$.
+In contrast, there is no obvious reason for the topotactic orientation of an agglomerate consisting exclusively of C-Si dimers, which would necessarily involve a much more profound change in structure for the transition into SiC.
+
+Conclusions on the SiC precipitation mechanism in Si, which additionally include and consider results of the molecular dynamics investigations presented in the following, are elaborated in more detail within the comprehensive description in chapter~\ref{chapter:summary}.
+
+%Prevailing conditions in the IBS process at elevated temperatures and the fact that IBS is a nonequilibrium process reinforce the possibility of formation of substitutional C instead of the thermodynamically stable C-Si dumbbell interstitials predicted by simulations at zero Kelvin.
+\label{section:defects:noneq_process_02}
+
+\ifnum1=0
+
+In addition, there are experimental findings, which might be exploited to reinforce the non-validity of the proposed precipitation model.
+High resolution TEM shows equal orientation of \hkl(h k l) planes of the c-Si host matrix and the 3C-SiC precipitate.
+
+Formation of 3C-SiC realized by successive formation of substitutional C, in which the atoms belonging to one of the two fcc lattices are substituted by C atoms perfectly conserves the \hkl(h k l) planes of the initial c-Si diamond lattice.
+
+Silicon self-interstitials consecutively created to the same degree are able to diffuse into the c-Si host one after another.
+
+Investigated combinations of C interstitials, however, result in distorted configurations, in which C atoms, which at some point will form SiC, are no longer aligned to the host.
+
+It is easily understandable that the mismatch in alignment will increase with increasing defect density.
+
+In addition, the amount of Si self-interstitials equal to the amount of agglomerated C atoms would be released all of a sudden probably not being able to diffuse into the c-Si host matrix without damaging the Si surrounding or the precipitate itself.
+
+In addition, IBS results in the formation of the cubic polytype of SiC only.
+
+As this result conforms well with the model of precipitation by substitutional C there is no obvious reason why hexagonal polytypes should not be able to form or an equal alignment would be mandatory assuming the model of precipitation by C-Si dumbbell agglomeration.
+
+\fi