Obtained results for separated point defects in Si are in good agreement to previous theoretical work on this subject, both for intrinsic defects~\cite{leung99,al-mushadani03} as well as for C point defects~\cite{dal_pino93,capaz94}.
The ground-state configurations of these defects, i.e.\ the Si$_{\text{i}}$ \hkl<1 1 0> and C$_{\text{i}}$ \hkl<1 0 0> DB, are reproduced and compare well to previous findings of theoretical investigations on Si$_{\text{i}}$~\cite{leung99,al-mushadani03} as well as theoretical~\cite{dal_pino93,capaz94,burnard93,leary97,jones04} and experimental~\cite{watkins76,song90} studies on C$_{\text{i}}$.
Obtained results for separated point defects in Si are in good agreement to previous theoretical work on this subject, both for intrinsic defects~\cite{leung99,al-mushadani03} as well as for C point defects~\cite{dal_pino93,capaz94}.
The ground-state configurations of these defects, i.e.\ the Si$_{\text{i}}$ \hkl<1 1 0> and C$_{\text{i}}$ \hkl<1 0 0> DB, are reproduced and compare well to previous findings of theoretical investigations on Si$_{\text{i}}$~\cite{leung99,al-mushadani03} as well as theoretical~\cite{dal_pino93,capaz94,burnard93,leary97,jones04} and experimental~\cite{watkins76,song90} studies on C$_{\text{i}}$.