added quamol ref
[lectures/latex.git] / bibdb / bibdb.bib
index d1ffeb0..b5a1af2 100644 (file)
   year =         "1994",
   doi =          "10.1557/PROC-354-171",
   URL =          "http://dx.doi.org/10.1557/PROC-354-171",
-  eprint =       "http://journals.cambridge.org/article_S1946427400420853",
   notes =        "first time ibs at moderate temperatures",
 }
 
   notes =        "norm-conserving pseudopotentials",
 }
 
+@Article{kleinman82,
+  journal =      "Phys. Rev. Lett.",
+  month =        may,
+  doi =          "10.1103/PhysRevLett.48.1425",
+  issue =        "20",
+  author =       "Leonard Kleinman and D. M. Bylander",
+  title =        "Efficacious Form for Model Pseudopotentials",
+  year =         "1982",
+  URL =          "http://link.aps.org/doi/10.1103/PhysRevLett.48.1425",
+  publisher =    "American Physical Society",
+  pages =        "1425--1428",
+  volume =       "48",
+}
+
 @Article{troullier91,
   title =        "Efficient pseudopotentials for plane-wave
                  calculations",
                  si",
 }
 
+@Article{jones89,
+  doi =          "10.1103/RevModPhys.61.689",
+  month =        jul,
+  issue =        "3",
+  author =       "R. O. Jones and O. Gunnarsson",
+  year =         "1989",
+  URL =          "http://link.aps.org/doi/10.1103/RevModPhys.61.689",
+  publisher =    "American Physical Society",
+  title =        "The density functional formalism, its applications and
+                 prospects",
+  pages =        "689--746",
+  journal =      "Rev. Mod. Phys.",
+  volume =       "61",
+  notes =        "dft intro",
+}
+
 @Article{park02,
   author =       "S. Y. Park and J. D'Arcy-Gall and D. Gall and J. A. N.
                  T Soares and Y.-W. Kim and H. Kim and P. Desjardins and
                  Road 44135 Cleveland OH",
   title =        "Progress in silicon carbide semiconductor electronics
                  technology",
-  journal =      "Journal of Electronic Materials",
+  journal =      "J. Electron. Mater.",
   publisher =    "Springer Boston",
   ISSN =         "0361-5235",
   keyword =      "Chemistry and Materials Science",
                  R. P. Smith and S. T. Allen and T. J. Smith and Z. Ring
                  and J. J. Sumakeris and A. W. Saxler and J. W.
                  Milligan",
-  booktitle =    "Microwave Symposium Digest, 2002 IEEE MTT-S
-                 International",
+  booktitle =    "2002 IEEE MTT-S International Microwave Symposium
+                 Digest",
   title =        "Applications of Si{C} {MESFET}s and Ga{N} {HEMT}s in
                  power amplifier design",
   year =         "2002",
   month =        "",
-  volume =       "3",
+  volume =       "",
   number =       "",
   pages =        "1819--1822",
   doi =          "10.1109/MWSYM.2002.1012216",
   author =       "F. Temcamani and P. Pouvil and O. Noblanc and C.
                  Brylinski and P. Bannelier and B. Darges and J. P.
                  Prigent",
-  booktitle =    "Microwave Symposium Digest, 2001 IEEE MTT-S
-                 International",
+  booktitle =    "2001 IEEE MTT-S International Microwave Symposium
+                 Digest",
   title =        "Silicon carbide {MESFET}s performances and application
                  in broadcast power amplifiers",
   year =         "2001",
   month =        "",
-  volume =       "2",
+  volume =       "",
   number =       "",
   pages =        "641--644",
   doi =          "10.1109/MWSYM.2001.966976",
                  and Valeri Afanas'ev and Hiroshi Yano and Tsunenobu
                  Kimoto and Hiroyuki Matsunami",
   title =        "Traps at the Si{C}/Si{O2}-Interface",
-  journal =      "MRS Online Proceedings Library",
+  journal =      "MRS Proc.",
   volume =       "640",
   number =       "",
   pages =        "",
   year =         "2000",
   doi =          "10.1557/PROC-640-H3.2",
   URL =          "http://dx.doi.org/10.1557/PROC-640-H3.2",
-  eprint =       "http://journals.cambridge.org/article_S1946427400647061",
 }
 
 @Article{bhatnagar93,
   author =       "M. Bhatnagar and B. J. Baliga",
-  journal =      "Electron Devices, IEEE Transactions on",
+  journal =      "IEEE Trans. Electron Devices",
   title =        "Comparison of 6{H}-Si{C}, 3{C}-Si{C}, and Si for power
                  devices",
   year =         "1993",
   notes =        "comparison 3c 6h sic and si devices",
 }
 
+@Article{ryu01,
+  author =       "Sei-Hyung Ryu and A. K. Agarwal and R. Singh and J. W.
+                 Palmour",
+  journal =      "IEEE Electron Device Lett.",
+  title =        "1800 {V} {NPN} bipolar junction transistors in
+                 4{H}-Si{C}",
+  year =         "2001",
+  month =        mar,
+  volume =       "22",
+  number =       "3",
+  pages =        "124--126",
+  keywords =     "1800 V;4H-SiC high-voltage n-p-n bipolar junction
+                 transistor;SiC;blocking voltage;current gain;deep level
+                 acceptor;minority carrier lifetime;on-resistance;power
+                 switching device;temperature coefficient;carrier
+                 lifetime;deep levels;minority carriers;power bipolar
+                 transistors;silicon compounds;wide band gap
+                 semiconductors;",
+  doi =          "10.1109/55.910617",
+  ISSN =         "0741-3106",
+}
+
+@Article{baliga96,
+  author =       "B. J. Baliga",
+  journal =      "IEEE Trans. Electron Devices",
+  title =        "Trends in power semiconductor devices",
+  year =         "1996",
+  month =        oct,
+  volume =       "43",
+  number =       "10",
+  pages =        "1717--1731",
+  keywords =     "DMOS technology;GTO;GaAs;IGBT;MOS-gated
+                 devices;MOS-gated thyristors;MPS rectifier;PIN
+                 rectifier;Schottky rectifier;Si;SiC;SiC based
+                 switches;TMBS rectifier;UMOS technology;VMOS
+                 technology;bipolar power transistor;high voltage power
+                 rectifiers;low voltage power rectifiers;power
+                 MOSFET;power losses;power semiconductor devices;power
+                 switch technology;review;semiconductor device
+                 technology;MOS-controlled thyristors;bipolar transistor
+                 switches;field effect transistor switches;gallium
+                 arsenide;insulated gate bipolar transistors;p-i-n
+                 diodes;power bipolar transistors;power field effect
+                 transistors;power semiconductor devices;power
+                 semiconductor diodes;power semiconductor
+                 switches;reviews;silicon;silicon compounds;solid-state
+                 rectifiers;thyristors;",
+  doi =          "10.1109/16.536818",
+  ISSN =         "0018-9383",
+}
+
+@Article{bhatnagar92,
+  author =       "M. Bhatnagar and P. K. McLarty and B. J. Baliga",
+  journal =      "IEEE Electron Device Lett.",
+  title =        "Silicon-carbide high-voltage (400 {V}) Schottky
+                 barrier diodes",
+  year =         "1992",
+  month =        oct,
+  volume =       "13",
+  number =       "10",
+  pages =        "501--503",
+  keywords =     "1.1 V;25 to 200 C;400 V;6H-SiC;Pt-SiC;Schottky barrier
+                 diodes;breakdown
+                 voltages;characteristics;fabrication;forward I-V
+                 characteristics;forward voltage drop;on-state current
+                 density;rectifiers;reverse I-V characteristics;reverse
+                 recovery characteristics;sharp breakdown;temperature
+                 range;Schottky-barrier diodes;platinum;power
+                 electronics;semiconductor materials;silicon
+                 compounds;solid-state rectifiers;",
+  doi =          "10.1109/55.192814",
+  ISSN =         "0741-3106",
+}
+
 @Article{neudeck94,
   author =       "P. G. Neudeck and D. J. Larkin and J. E. Starr and J.
                  A. Powell and C. S. Salupo and L. G. Matus",
-  journal =      "Electron Devices, IEEE Transactions on",
+  journal =      "IEEE Trans. Electron Devices",
   title =        "Electrical properties of epitaxial 3{C}- and
                  6{H}-Si{C} p-n junction diodes produced side-by-side on
                  6{H}-Si{C} substrates",
                  substrate",
 }
 
+@Article{weitzel96,
+  author =       "C. E. Weitzel and J. W. Palmour and Jr. {Carter, C.H.}
+                 and K. Moore and K. K. Nordquist and S. Allen and C.
+                 Thero and M. Bhatnagar",
+  journal =      "IEEE Trans. Electron Devices",
+  title =        "Silicon carbide high-power devices",
+  year =         "1996",
+  month =        oct,
+  volume =       "43",
+  number =       "10",
+  pages =        "1732--1741",
+  keywords =     "1200 V;1400 V;4H-SiC;500 MHz to 32 GHz;57 W;Schottky
+                 barrier diodes;SiC;SiC devices;UMOSFET;current
+                 density;high electric breakdown field;high saturated
+                 electron drift velocity;high thermal
+                 conductivity;high-power devices;packaged SIT;submicron
+                 gate length MESFET;Schottky diodes;current
+                 density;electric breakdown;power MESFET;power
+                 MOSFET;power semiconductor devices;power semiconductor
+                 diodes;reviews;silicon compounds;static induction
+                 transistors;wide band gap semiconductors;",
+  doi =          "10.1109/16.536819",
+  ISSN =         "0018-9383",
+  notes =        "high power devices",
+}
+
+@Article{zhu08,
+  author =       "Lin Zhu and T. P. Chow",
+  journal =      "IEEE Trans. Electron Devices",
+  title =        "Advanced High-Voltage 4{H}-Si{C} Schottky Rectifiers",
+  year =         "2008",
+  month =        aug,
+  volume =       "55",
+  number =       "8",
+  pages =        "1871--1874",
+  keywords =     "H-SiC;OFF-state characteristics;ON-state
+                 characteristics;blocking capability;high-voltage
+                 Schottky rectifier;junction barrier Schottky
+                 rectifier;lateral channel JBS rectifier;leakage
+                 current;pinlike reverse characteristics;Schottky
+                 barriers;Schottky diodes;leakage currents;rectifying
+                 circuits;",
+  doi =          "10.1109/TED.2008.926642",
+  ISSN =         "0018-9383",
+}
+
+@Article{brown93,
+  author =       "D. M. Brown and E. T. Downey and M. Ghezzo and J. W.
+                 Kretchmer and R. J. Saia and Y. S. Liu and J. A. Edmond
+                 and G. Gati and J. M. Pimbley and W. E. Schneider",
+  journal =      "IEEE Trans. Electron Devices",
+  title =        "Silicon carbide {UV} photodiodes",
+  year =         "1993",
+  month =        feb,
+  volume =       "40",
+  number =       "2",
+  pages =        "325--333",
+  keywords =     "200 to 400 nm;6H epitaxial layers;SiC photodiodes;UV
+                 responsivity characteristics;low dark current;low light
+                 level UV detection;quantum
+                 efficiency;reproducibility;reverse current
+                 leakage;short circuit output current;leakage
+                 currents;photodiodes;semiconductor
+                 materials;short-circuit currents;silicon
+                 compounds;ultraviolet detectors;",
+  doi =          "10.1109/16.182509",
+  ISSN =         "0018-9383",
+  notes =        "sic photo diodes, uv detector",
+}
+
+@Article{yan04,
+  author =       "Feng Yan and Xiaobin Xin and S. Aslam and Yuegang Zhao
+                 and D. Franz and J. H. Zhao and M. Weiner",
+  journal =      "IEEE J. Quantum Electron.",
+  title =        "4{H}-Si{C} {UV} photo detectors with large area and
+                 very high specific detectivity",
+  year =         "2004",
+  month =        sep,
+  volume =       "40",
+  number =       "9",
+  pages =        "1315--1320",
+  keywords =     "-1 V; 1.2E-14 A; 210 to 350 nm; 4H-SiC UV
+                 photodetectors; 5 mm; Pt/4H-SiC Schottky photodiodes;
+                 SiC-Pt; leakage current; photoresponse spectra; quantum
+                 efficiency; specific detectivity; Schottky diodes;
+                 photodetectors; platinum; silicon compounds; wide band
+                 gap semiconductors;",
+  doi =          "10.1109/JQE.2004.833196",
+  ISSN =         "0018-9197",
+  notes =        "uv detector",
+}
+
 @Article{schulze98,
   author =       "N. Schulze and D. L. Barrett and G. Pensl",
   collaboration = "",
   notes =        "micropipe free 6h-sic pvt growth",
 }
 
+@Article{frank51,
+  author =       "F. C. Frank",
+  title =        "Capillary equilibria of dislocated crystals",
+  journal =      "Acta Crystallogr.",
+  year =         "1951",
+  volume =       "4",
+  number =       "6",
+  pages =        "497--501",
+  month =        nov,
+  doi =          "10.1107/S0365110X51001690",
+  URL =          "http://dx.doi.org/10.1107/S0365110X51001690",
+  notes =        "micropipe",
+}
+
+@Article{heindl97,
+  author =       "J. Heindl and H. P. Strunk and V. D. Heydemann and G.
+                 Pensl",
+  title =        "Micropipes: Hollow Tubes in Silicon Carbide",
+  journal =      "phys. status solidi (a)",
+  volume =       "162",
+  number =       "1",
+  publisher =    "WILEY-VCH Verlag",
+  ISSN =         "1521-396X",
+  URL =          "http://dx.doi.org/10.1002/1521-396X(199707)162:1<251::AID-PSSA251>3.0.CO;2-7",
+  doi =          "10.1002/1521-396X(199707)162:1<251::AID-PSSA251>3.0.CO;2-7",
+  pages =        "251--262",
+  year =         "1997",
+  notes =        "micropipe",
+}
+
+@Article{neudeck94_2,
+  author =       "P. G. Neudeck and J. A. Powell",
+  journal =      "IEEE Electron Device Lett.",
+  title =        "Performance limiting micropipe defects in silicon
+                 carbide wafers",
+  year =         "1994",
+  month =        feb,
+  volume =       "15",
+  number =       "2",
+  pages =        "63--65",
+  keywords =     "SiC;defect density;device ratings;epitaxially-grown pn
+                 junction devices;micropipe defects;power devices;power
+                 semiconductors;pre-avalanche reverse-bias point
+                 failures;p-n homojunctions;power
+                 electronics;semiconductor materials;silicon
+                 compounds;",
+  doi =          "10.1109/55.285372",
+  ISSN =         "0741-3106",
+}
+
 @Article{pirouz87,
   author =       "P. Pirouz and C. M. Chorey and J. A. Powell",
   collaboration = "",
   version =      "A3R4",
   howpublished = "Patent Application",
   nationality =  "WO",
-  URL =          "http://www.patentlens.net/patentlens/patent/WO_2003_034484_A3R4/en/",
   filing_num =   "EP0211423",
   yearfiled =    "2002",
   monthfiled =   "10",
                  provides a corresponding layered semiconductor
                  structure.",
 }
+
+@Article{zunger01,
+  author =       "Alex Zunger",
+  title =        "Pseudopotential Theory of Semiconductor Quantum Dots",
+  journal =      "physica status solidi (b)",
+  volume =       "224",
+  number =       "3",
+  publisher =    "WILEY-VCH Verlag Berlin GmbH",
+  ISSN =         "1521-3951",
+  URL =          "http://dx.doi.org/10.1002/(SICI)1521-3951(200104)224:3<727::AID-PSSB727>3.0.CO;2-9",
+  doi =          "10.1002/(SICI)1521-3951(200104)224:3<727::AID-PSSB727>3.0.CO;2-9",
+  pages =        "727--734",
+  keywords =     "71.15.Dx, 73.21.La, S5.11, S5.12, S7.11, S7.12, S8.11,
+                 S8.12",
+  year =         "2001",
+  notes =        "configuration-interaction method, ci",
+}
+
+@Article{robertson90,
+  author =       "I. J. Robertson and M. C. Payne",
+  title =        "k-point sampling and the k.p method in pseudopotential
+                 total energy calculations",
+  journal =      "Journal of Physics: Condensed Matter",
+  volume =       "2",
+  number =       "49",
+  pages =        "9837",
+  URL =          "http://stacks.iop.org/0953-8984/2/i=49/a=010",
+  year =         "1990",
+  notes =        "kp method",
+}
+
+@Article{lange11,
+  volume =       "84",
+  journal =      "Phys. Rev. B",
+  author =       "Bj{\"o}rn Lange and Christoph Freysoldt and J{\"o}rg
+                 Neugebauer",
+  month =        aug,
+  URL =          "http://link.aps.org/doi/10.1103/PhysRevB.84.085101",
+  doi =          "10.1103/PhysRevB.84.085101",
+  year =         "2011",
+  title =        "Construction and performance of fully numerical
+                 optimum atomic basis sets",
+  issue =        "8",
+  publisher =    "American Physical Society",
+  numpages =     "11",
+  pages =        "085101",
+  notes =        "quamol, basis set, for planc",
+}
+