X-Git-Url: https://hackdaworld.org/gitweb/?p=lectures%2Flatex.git;a=blobdiff_plain;f=posic%2Fthesis%2Fsic.tex;h=13028041cd7803027f2199668811b1981a88c714;hp=0379687e3eab31da63bc58ad8aa752a43daaf38b;hb=7172b51cc6e940031eb4660d0d12548781c33f09;hpb=12c64d4502d806d2847788c2403cdae155f435cd

diff --git a/posic/thesis/sic.tex b/posic/thesis/sic.tex
index 0379687..1302804 100644
--- a/posic/thesis/sic.tex
+++ b/posic/thesis/sic.tex
@@ -342,7 +342,7 @@ However, there is great interest to incorporate C onto substitutional lattice si
 Thus, substitutional C enables strain engineering of Si and Si/Si$_{1-x}$Ge$_x$ heterostructures \cite{yagi02,chang05,kissinger94,osten97}, which is used to increase charge carrier mobilities in Si as well as to adjust its band structure \cite{soref91,kasper91}.
 % increase of C at substitutional sites
 Epitaxial layers with \unit[1.4]{at.\%} of substitutional C have been successfully synthesized in preamorphized Si$_{0.86}$Ge$_{0.14}$ layers, which were grown by CVD on Si substrates, using multiple-energy C implantation followed by solid-physe epitaxial regrowth at \unit[700]{$^{\circ}$C} \cite{strane93}.
-The tensile strain induced by the C atoms is found to compensates the compressive strain present due to the Ge atoms.
+The tensile strain induced by the C atoms is found to compensate the compressive strain present due to the Ge atoms.
 Studies on the thermal stability of Si$_{1-y}$C$_y$/Si heterostructures formed in the same way and equal C concentrations showed a loss of substitutional C accompanied by strain relaxation for temperatures ranging from \unit[810-925]{$^{\circ}$C} and the formation of spherical 3C-SiC precipitates with diameters of \unit[2-4]{nm}, which are incoherent but aligned to the Si host \cite{strane94}.
 During the initial stages of precipitation C-rich clusters are assumed, which maintain coherency with the Si matrix and the associated biaxial strain.
 Using this technique a metastable solubility limit was achieved, which corresponds to a C concentration exceeding the solid solubility limit at the Si melting point by nearly three orders of magnitude and, furthermore, a reduction of the defect denisty near the metastable solubility limit is assumed if the regrowth temperature is increased by rapid thermal annealing \cite{strane96}.
@@ -359,7 +359,7 @@ Indeed, closely investigating the large amount of literature pulled up in the la
 High resolution transmission electron microscopy (HREM) investigations of C-implanted Si at room temperature followed by rapid thermal annealing (RTA) show the formation of C-Si dumbbell agglomerates, which are stable up to annealing temperatures of about \unit[700-800]{$^{\circ}$C}, and a transformation into 3C-SiC precipitates at higher temperatures \cite{werner96,werner97}.
 The precipitates with diamateres between \unit[2]{nm} and \unit[5]{nm} are incorporated in the Si matrix without any remarkable strain fields, which is explained by the nearly equal atomic density of C-Si agglomerates and the SiC unit cell.
 Implantations at \unit[500]{$^{\circ}$C} likewise suggest an initial formation of C-Si dumbbells on regular Si lattice sites, which agglomerate into large clusters \cite{lindner99_2}.
-The agglomerates of such dimers, which do not generate lattice strain but lead to a local increase of the lattice potential \cite{werner96}, are indicated by dark contrasts and otherwise undisturbed Si lattice fringes in HREM, as can be seen in Fig.~\ref{fig:sic:hrem:c-si}.
+The agglomerates of such dimers, which do not generate lattice strain but lead to a local increase of the lattice potential \cite{werner96,wener97}, are indicated by dark contrasts and otherwise undisturbed Si lattice fringes in HREM, as can be seen in Fig.~\ref{fig:sic:hrem:c-si}.
 \begin{figure}[t]
 \begin{center}
 \subfigure[]{\label{fig:sic:hrem:c-si}\includegraphics[width=0.25\columnwidth]{tem_c-si-db.eps}}
@@ -418,6 +418,7 @@ On the other hand, processes relying upon prevention of precipitation in order t
 % eichhorn02: high imp temp more efficient than postimp treatment
 % eichhorn99: same as 02 + c-si agglomerates at low concentrations
 % strane94/guedj98: my model - c redist by si int (spe) and surface diff (mbe)
+% serre95: low/high t implants -> mobile c_i / non-mobile sic precipitates
 
 % todo
 % own polytype stacking sequence image