+The possibility for separated configurations of \cs{} and \si{} becomes even more likely if one of the constituents exhibits a low barrier of migration.
+In this case, the \si{} is assumed to constitute the mobile defect compared to the stable \cs{} atom.
+Thus, migration paths of \si{} are investigated in the following excursus.
+According to Fig.~\ref{fig:defects:si_mig1}, an activation energy of \unit[0.67]{eV} is necessary for the transition of the \si{} \hkl[0 -1 1] to \hkl[1 1 0] DB located at the neighbored Si lattice site in \hkl[1 1 -1] direction.
+\begin{figure}[tp]
+\begin{center}
+\includegraphics[width=0.7\textwidth]{si_110_110_mig_02_conf.ps}
+\end{center}
+\caption[Migration barrier and structures of the \si{} {\hkl[0 -1 1]} DB to the {\hkl[1 1 0]} DB transition.]{Migration barrier and structures of the \si{} \hkl[0 -1 1] DB (left) to the \hkl[1 1 0] DB (right) transition. Bonds are illustrated by blue lines.}
+\label{fig:defects:si_mig1}
+\end{figure}
+The barrier, which is even lower than the one for \ci{}, indeed indicates highly mobile \si.
+In fact, a similar transition is expected if the \si{} atom, which does not change the lattice site during transition, is located next to a \cs{} atom.
+Due to the low barrier the initial separation of the \cs{} and \si{} atom are very likely to occur.
+Further investigations revealed transition barriers of \unit[0.94]{eV} for the Si$_{\text{i}}$ \hkl[1 1 0] DB to the hexagonal Si$_{\text{i}}$, \unit[0.53]{eV} for the Si$_{\text{i}}$ \hkl[1 1 0] DB to the tetrahedral Si$_{\text{i}}$ and \unit[0.35]{eV} for the hexagonal Si$_{\text{i}}$ to the tetrahedral Si$_{\text{i}}$ configuration.
+The respective configurational energies are shown in Fig.~\ref{fig:defects:si_mig2}.
+\begin{figure}[tp]
+\begin{center}
+\includegraphics[width=0.7\textwidth]{si_mig_rest.ps}
+\end{center}
+\caption[Migration barrier of the \si{} {\hkl[1 1 0]} DB into the hexagonal and tetrahedral configuration as well as the hexagonal \si{} to tetrahedral \si{} transition.]{Migration barrier of the \si{} \hkl[1 1 0] DB into the hexagonal (H) and tetrahedral (T) configuration as well as the hexagonal \si{} to tetrahedral \si{} transition.}
+\label{fig:defects:si_mig2}
+\end{figure}
+The obtained activation energies are of the same order of magnitude than values derived from other {\em ab initio} studies \cite{bloechl93,sahli05}.
+The low barriers indeed enable configurations of further separated \cs{} and \si{} atoms by the highly mobile \si{} atom departing from the \cs{} defect as observed in the previously discussed MD simulation.
+
+% kept for nostalgical reason!
+
+%\section{Migration in systems of combined defects}
+
+%\begin{figure}[tp]
+%\begin{center}
+%\includegraphics[width=13cm]{vasp_mig/comb_mig_3-2_vac_fullct.ps}\\[2.0cm]
+%\begin{picture}(0,0)(170,0)
+%\includegraphics[width=3cm]{vasp_mig/comb_2-1_init.eps}
+%\end{picture}
+%\begin{picture}(0,0)(80,0)
+%\includegraphics[width=3cm]{vasp_mig/comb_2-1_seq_03.eps}
+%\end{picture}
+%\begin{picture}(0,0)(-10,0)
+%\includegraphics[width=3cm]{vasp_mig/comb_2-1_seq_06.eps}
+%\end{picture}
+%\begin{picture}(0,0)(-120,0)
+%\includegraphics[width=3cm]{vasp_mig/comb_2-1_final.eps}
+%\end{picture}
+%\begin{picture}(0,0)(25,20)
+%\includegraphics[width=2.5cm]{100_arrow.eps}
+%\end{picture}
+%\begin{picture}(0,0)(230,0)
+%\includegraphics[height=2.2cm]{001_arrow.eps}
+%\end{picture}
+%\end{center}
+%\caption{Transition of the configuration of the C-Si dumbbell interstitial in combination with a vacancy created at position 2 into the configuration of substitutional carbon.}
+%\label{fig:defects:comb_mig_01}
+%\end{figure}
+%\begin{figure}[tp]
+%\begin{center}
+%\includegraphics[width=13cm]{vasp_mig/comb_mig_4-2_vac_fullct.ps}\\[1.0cm]
+%\begin{picture}(0,0)(150,0)
+%\includegraphics[width=2cm]{vasp_mig/comb_3-1_init.eps}
+%\end{picture}
+%\begin{picture}(0,0)(60,0)
+%\includegraphics[width=2cm]{vasp_mig/comb_3-1_seq_03.eps}
+%\end{picture}
+%\begin{picture}(0,0)(-45,0)
+%\includegraphics[width=2cm]{vasp_mig/comb_3-1_seq_07.eps}
+%\end{picture}
+%\begin{picture}(0,0)(-130,0)
+%\includegraphics[width=2cm]{vasp_mig/comb_3-1_final.eps}
+%\end{picture}
+%\begin{picture}(0,0)(25,20)
+%\includegraphics[width=2.5cm]{100_arrow.eps}
+%\end{picture}
+%\begin{picture}(0,0)(230,0)
+%\includegraphics[height=2.2cm]{001_arrow.eps}
+%\end{picture}
+%\end{center}
+%\caption{Transition of the configuration of the C-Si dumbbell interstitial in combination with a vacancy created at position 3 into the configuration of substitutional carbon.}
+%\label{fig:defects:comb_mig_02}
+%\end{figure}
+
+\section{Applicability: Competition of \ci{} and \cs-\si{}}
+\label{section:ea_app}
+
+As has been shown, the energetically most favorable configuration of \cs{} and \si{} is obtained for \cs{} located at the neighbored lattice site along the \hkl<1 1 0> bond chain of a Si$_{\text{i}}$ \hkl<1 1 0> DB.
+However, the energy of formation is slightly higher than that of the C$_{\text{i}}$ \hkl<1 0 0> DB, which constitutes the ground state for a C impurity introduced into otherwise perfect c-Si.
+
+For a possible clarification of the controversial views on the participation of C$_{\text{s}}$ in the precipitation mechanism by classical potential simulations, test calculations need to ensure the proper description of the relative formation energies of combined structures of C$_{\text{s}}$ and Si$_{\text{i}}$ compared to C$_{\text{i}}$.
+This is particularly important since the energy of formation of C$_{\text{s}}$ is drastically underestimated by the EA potential.
+A possible occurrence of C$_{\text{s}}$ could then be attributed to a lower energy of formation of the C$_{\text{s}}$-Si$_{\text{i}}$ combination due to the low formation energy of C$_{\text{s}}$, which is obviously wrong.