+Due to the limitations of short range potentials and conventional MD as discussed above elevated temperatures are used in the following.
+The simulation sequence and other parameters aside system temperature remain unchanged as in section \ref{subsection:initial_sims}.
+Since there is no significant difference among the $V_2$ and $V_3$ simulations only the $V_1$ and $V_2$ simulations are carried on and refered to as low carbon and high carbon concentration simulations.
+Temperatures ranging from $450\,^{\circ}\mathrm{C}$ up to $2050\,^{\circ}\mathrm{C}$ are used.
+
+A simple quality value $Q$ is introduced, which helps to estimate the progress of structural evolution.
+In bulk 3C-SiC every C atom has four next neighboured Si atoms and every Si atom four next neighboured C atoms.
+The quality could be determined by counting the amount of atoms which form bonds to four atoms of the other species.
+However, the aim of the simulation on hand is to reproduce the formation of a 3C-SiC precipitate embedded in c-Si.
+The amount of Si atoms and, thus, the amount of Si atoms remaining in the silicon diamond lattice is much higher than the amount of inserted C atoms.
+Thus, counting the atoms, which exhibit proper coordination is limited to the C atoms.
+The quality value is defined to be
+\begin{equation}
+Q = \frac{\text{Amount of C atoms with 4 next neighboured Si atoms}}
+ {\text{Total amount of C atoms}} \text{ .}
+\label{eq:md:qdef}
+\end{equation}
+By this, bulk 3C-SiC will still result in $Q=1$ and precipitates will also reach values close to one.
+However, since the quality value does not account for bond lengthes, bond angles, crystallinity or the stacking sequence high values of $Q$ not necessarily correspond to structures close to 3C-SiC.
+Structures that look promising due to high quality values need to be further investigated by other means.
+
+\begin{figure}[!ht]
+\begin{center}
+\includegraphics[width=12cm]{tot_pc_thesis.ps}\\
+\includegraphics[width=12cm]{tot_ba.ps}
+\end{center}
+\caption[Si-C radial distribution and quality evolution for the low concentration simulations at different elevated temperatures.]{Si-C radial distribution and quality evolution for the low concentration simulations at different elevated temperatures. All structures are cooled down to $20\,^{\circ}\mathrm{C}$. The grey line shows resulting Si-C bonds in a configuration of substitutional C in c-Si (C$_\text{sub}$) at zero temperature. Arrows in the quality plot mark the end of carbon insertion and the start of the cooling down step. A fit function according to equation \eqref{eq:md:fit} shows the estimated evolution of quality in the absence of the cooling down sequence.}
+\label{fig:md:tot_si-c_q}
+\end{figure}
+Figure \ref{fig:md:tot_si-c_q} shows the radial distribution of Si-C bonds for different temperatures and the corresponding quality evolution as defined earlier for the low concentration simulaton, that is the $V_1$ simulation.
+The first noticeable and promising change in the Si-C radial distribution is the successive decline of the artificial peak at the Si-C cut-off distance with increasing temperature up to the point of disappearance at temperatures above $1650\,^{\circ}\mathrm{C}$.
+The system provides enough kinetic energy to affected atoms, which are able to escape the cut-off region.
+Another important observation in structural change is exemplified in the two shaded areas.
+In the grey shaded region a decrease of the peak at 0.186 nm and the bump at 0.175 nm and a concurrent increase of the peak at 0.197 nm with increasing temperature is visible.
+Similarly the peaks at 0.335 nm and 0.386 nm shrink in contrast to a new peak forming at 0.372 nm as can be seen in the yellow shaded region.
+Obviously the structure obtained from the $450\,^{\circ}\mathrm{C}$ simulations, which is dominated by the existence of \hkl<1 0 0> C-Si dumbbells transforms into a different structure with increasing simulation temperature.
+Investigations of the atomic data reveal substitutional carbon to be responsible for the new Si-C bonds.
+The peak at 0.197 nm corresponds to the distance of a substitutional carbon to the next neighboured silicon atoms.
+The one at 0.372 is the distance of the substitutional carbon atom to the second next silicon neighbour along the \hkl<1 1 0> direction.
+Comparing the radial distribution for the Si-C bonds at $2050\,^{\circ}\mathrm{C}$ to the resulting Si-C bonds in a configuration of a substitutional carbon atom in crystalline silicon excludes all possibility of doubt.
+The resulting bonds perfectly match and, thus, explain the peaks observed for the increased temperature simulations.
+To conclude, by increasing the simulation temperature, the \hkl<1 0 0> C-Si dumbbell characterized structure transforms into a structure dominated by substitutional C.
+
+This is also reflected in the quality values obtained for different temperatures.
+While simulations at $450\,^{\circ}\mathrm{C}$ exhibit 10 \% of fourfold coordinated carbon simulations at $2050\,^{\circ}\mathrm{C}$ exceed the 80 \% range.
+Since substitutional carbon has four next neighboured silicon atoms and is the preferential type of defect in elevated temperature simulations the increase of the quality values become evident.
+The quality values at a fixed temperature increase with simulation time.
+After the end of the insertion sequence marked by the first arrow the quality is increasing and a saturation behaviour, yet before the cooling process starts, can be expected.
+The evolution of the quality value of the simulation at $2050\,^{\circ}\mathrm{C}$ inside the range in which the simulation is continued at constant temperature for 100 fs is well approximated by the simple fit function
+\begin{equation}
+f(t)=a-\frac{b}{t} \text{ ,}
+\label{eq:md:fit}
+\end{equation}
+which results in a saturation value of 93 \%.
+Obviously the decrease in temperature accelerates the saturation and inhibits further formation of substitutional carbon.
+Conclusions drawn from investigations of the quality evolution correlate well with the findings of the radial distribution results.
+
+\begin{figure}[!ht]
+\begin{center}
+\includegraphics[width=12cm]{tot_pc2_thesis.ps}\\
+\includegraphics[width=12cm]{tot_pc3_thesis.ps}
+\end{center}
+\caption[C-C and Si-Si radial distribution for the low concentration simulations at different elevated temperatures.]{C-C and Si-Si radial distribution for the low concentration simulations at different elevated temperatures. All structures are cooled down to $20\,^{\circ}\mathrm{C}$.}
+\label{fig:md:tot_c-c_si-si}
+\end{figure}
+
+\subsection{Constructed 3C-SiC precipitate in crystalline silicon}
+
+{\color{red}Todo: We want to know where we want to go ...}
+
+In the following a spherical 3C-SiC precipitate enclosed in a c-Si surrounding is constructed as it is expected from IBS experiments and from simulations that finally succeed simulating the precipitation event.
+On the one hand this sheds light on characteristic values like the radial distribution function or the total amount of energy for configurations that are aimed to be reproduced by simulation possibly enabling the prediction of conditions necessary for the simulation of the precipitation process.
+On the other hand, assuming a correct alignment of the precipitate with the c-Si matrix, investigations of the behaviour of such precipitates and the surrounding can be made.
+
+To construct a spherical 3C-SiC precipitate in c-Si, the approach illustrated in the following is applied.
+A total simulation volume $V$ consisting of 21 unit cells of c-Si in each direction is used.
+To obtain a minimal and stable precipitate 5500 carbon atoms are considered necessary.
+The initial precipitate configuration is constructed in two steps.
+In the first step the surrounding silicon matrix is created.
+This is realized by just skipping the generation of silicon atoms inside a sphere of radius $x$, which is the first unknown variable.
+The silicon lattice constant $a_{\text{Si}}$ of the surrounding c-Si matrix is assumed to not alter dramatically and, thus, is used for the initial lattice creation.
+In a second step 3C-SiC is created inside the empty sphere of radius $x$.
+The lattice constant $y$, the second unknown variable, is chosen in such a way, that the necessary amount of carbon is generated.
+This is entirely described by the system of equations \eqref{eq:md:constr_sic_01}
+\begin{equation}
+\frac{8}{a_{\text{Si}}^3}(
+\underbrace{21^3 a_{\text{Si}}^3}_{=V}
+-\frac{4}{3}\pi x^3)+
+\underbrace{\frac{4}{y^3}\frac{4}{3}\pi x^3}_{\stackrel{!}{=}5500}
+=21^3\cdot 8
+\label{eq:md:constr_sic_01}
+\text{ ,}
+\end{equation}
+which can be simplified to read
+\begin{equation}
+\frac{8}{a_{\text{Si}}^3}\frac{4}{3}\pi x^3=5500
+\Rightarrow x = \left(\frac{5500 \cdot 3}{32 \pi} \right)^{1/3}a_{\text{Si}}
+\label{eq:md:constr_sic_02}
+\end{equation}
+and
+\begin{equation}
+%x^3=\frac{16\pi}{5500 \cdot 3}y^3=
+%\frac{16\pi}{5500 \cdot 3}\frac{5500 \cdot 3}{32 \pi}a_{\text{Si}}^3
+%\Rightarrow
+y=\left(\frac{1}{2} \right)^{1/3}a_{\text{Si}}
+\text{ .}
+\label{eq:md:constr_sic_03}
+\end{equation}
+By this means values of 2.973 nm and 4.309 \AA{} are obtained for the initial precipitate radius and lattice constant of 3C-SiC.
+Since the generation of atoms is a discrete process with regard to the size of the volume the expected amounts of atoms are not obtained.
+However, by applying these values the final configuration varies only slightly from the expected one by five carbon and eleven silicon atoms, as can be seen in table \ref{table:md:sic_prec}.
+\begin{table}[!ht]
+\begin{center}
+\begin{tabular}{l c c c c}
+\hline
+\hline
+ & C in 3C-SiC & Si in 3C-SiC & Si in c-Si surrounding & total amount of Si\\
+\hline
+Expected & 5500 & 5500 & 68588 & 74088\\
+Obtained & 5495 & 5486 & 68591 & 74077\\
+Difference & 5 & 14 & -3 & 11\\
+\hline
+\hline
+\end{tabular}
+\caption{Comparison of the expected and obtained amounts of Si and C atoms by applying the values from equations \eqref{eq:md:constr_sic_02} and \eqref{eq:md:constr_sic_03} in the 3C-SiC precipitate construction approach.}
+\label{table:md:sic_prec}
+\end{center}
+\end{table}
+
+After the initial configuration is constructed some of the atoms located at the 3C-SiC/c-Si interface show small distances, which results in high repulsive forces acting on the atoms.
+Thus, the system is equilibrated using strong coupling to the heat bath, which is set to be $20\,^{\circ}\mathrm{C}$.
+Once the main part of th excess energy is carried out previous settings for the Berendsen thermostat are restored and the system is relaxed for another 10 ps.
+
+PC and energy of that one.
+
+Now let's see, whether annealing will lead to some energetically more favorable configurations.
+
+Estimate surface energy ...
+