\bibitem{spinella} C. Spinella, F. Priolo, R. A. Puglisi, S. Lombardo, S. U. Campisano. Nucl. Instr. and Meth. B 120 (1996) 198.
\bibitem{vook} F. L. Vook in: Radiation Damage and Defects in Semiconductors, ed. by J. E. Whitehouse. Inst. of Phys., London 1972, pp 60.
\bibitem{morehead_crowder} F. F. Morehead, B. L. Crowder. Rad. Eff. 6 (1970) 27.
+ \bibitem{gibbons} J. F. Gibbons. Proc. IEEE, Vol. 60, No. 9 (1972) 1062.
\bibitem{biersack_haggmark} J. P. Biersack, L. Haggmark. Nucl. Instr. and Meth. B 174 (1980) 257
\bibitem{lindner_appl_phys} J. K. N. Lindner. Appl. Phys. A 77 (2003) 27.
\bibitem{linnross} J. Linnross, R. G. Elliman, W. L. Brown. J. Matter. Res. 3 (1988) 1208.